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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/ShintaniMINKE21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Makoto_Eiki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masuo_Kajiyama>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michihiro_Shintani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Riaz-ul-haque_Mian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomoki_Nakamura>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC50571.2021.00018>
foaf:homepage <https://doi.org/10.1109/ITC50571.2021.00018>
dc:identifier DBLP conf/itc/ShintaniMINKE21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC50571.2021.00018 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Makoto_Eiki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masuo_Kajiyama>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michihiro_Shintani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Riaz-ul-haque_Mian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomoki_Nakamura>
swrc:pages 103-112 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2021>
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rdfs:seeAlso <https://doi.org/10.1109/ITC50571.2021.00018>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document