Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/ShintaniMINKE21
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/ShintaniMINKE21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Makoto_Eiki
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Masuo_Kajiyama
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michihiro_Shintani
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Riaz-ul-haque_Mian
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Tomoki_Nakamura
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FITC50571.2021.00018
>
foaf:
homepage
<
https://doi.org/10.1109/ITC50571.2021.00018
>
dc:
identifier
DBLP conf/itc/ShintaniMINKE21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FITC50571.2021.00018
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
rdfs:
label
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Makoto_Eiki
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Masuo_Kajiyama
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michihiro_Shintani
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Michiko_Inoue
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Riaz-ul-haque_Mian
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Tomoki_Nakamura
>
swrc:
pages
103-112
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/2021
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/ShintaniMINKE21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/ShintaniMINKE21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc2021.html#ShintaniMINKE21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ITC50571.2021.00018
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
Wafer-level Variation Modeling for Multi-site RF IC Testing via Hierarchical Gaussian Process.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document