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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/SinghK91>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/C._Mani_Krishna_0001>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.1991.519514>
foaf:homepage <https://doi.org/10.1109/TEST.1991.519514>
dc:identifier DBLP conf/itc/SinghK91 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.1991.519514 (xsd:string)
dcterms:issued 1991 (xsd:gYear)
rdfs:label On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/C._Mani_Krishna_0001>
swrc:pages 228-237 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1991>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/SinghK91/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/SinghK91>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1991.html#SinghK91>
rdfs:seeAlso <https://doi.org/10.1109/TEST.1991.519514>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document