On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/SinghK91
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/itc/SinghK91
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/C._Mani_Krishna_0001
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FTEST.1991.519514
>
foaf:
homepage
<
https://doi.org/10.1109/TEST.1991.519514
>
dc:
identifier
DBLP conf/itc/SinghK91
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FTEST.1991.519514
(xsd:string)
dcterms:
issued
1991
(xsd:gYear)
rdfs:
label
On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Adit_D._Singh
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/C._Mani_Krishna_0001
>
swrc:
pages
228-237
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/itc/1991
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/itc/SinghK91/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/itc/SinghK91
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/itc/itc1991.html#SinghK91
>
rdfs:
seeAlso
<
https://doi.org/10.1109/TEST.1991.519514
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/itc
>
dc:
title
On Optimizing Wafer-Probe Testing for Product Quality Using Die-Yield Prediction.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document