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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/SinhabahuLLWW22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._R._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jian-De_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nadun_Sinhabahu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC50671.2022.00071>
foaf:homepage <https://doi.org/10.1109/ITC50671.2022.00071>
dc:identifier DBLP conf/itc/SinhabahuLLWW22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC50671.2022.00071 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._R._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jian-De_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nadun_Sinhabahu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
swrc:pages 554-558 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/SinhabahuLLWW22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/SinhabahuLLWW22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2022.html#SinhabahuLLWW22>
rdfs:seeAlso <https://doi.org/10.1109/ITC50671.2022.00071>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Yield-Enhanced Probe Head Cleaning with AI-Driven Image and Signal Integrity Pattern Recognition for Wafer Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document