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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/SinhabahuLWWH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J._R._Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matt_Ho>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nadun_Sinhabahu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC51656.2023.00023>
foaf:homepage <https://doi.org/10.1109/ITC51656.2023.00023>
dc:identifier DBLP conf/itc/SinhabahuLWWH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC51656.2023.00023 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J._R._Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Katherine_Shu-Min_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matt_Ho>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nadun_Sinhabahu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sying-Jyan_Wang>
swrc:pages 93-98 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/SinhabahuLWWH23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/SinhabahuLWWH23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2023.html#SinhabahuLWWH23>
rdfs:seeAlso <https://doi.org/10.1109/ITC51656.2023.00023>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Machine-Learning Driven Sensor Data Analytics for Yield Enhancement of Wafer Probing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document