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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/SodenH86>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jerry_M._Soden>
dc:identifier DBLP conf/itc/SodenH86 (xsd:string)
dcterms:issued 1986 (xsd:gYear)
rdfs:label Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Charles_F._Hawkins>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jerry_M._Soden>
swrc:pages 443-451 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/1986>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/SodenH86/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/SodenH86>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc1986.html#SodenH86>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Reliability and Electrical Properties of Gate Oxide Shorts in CMOS ICs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document