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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/TangWVHWEPB04>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Friedrich_Hapke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Harald_P._E._Vranken>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ilia_Polian>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Wittke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yuyi_Tang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2004.1386980>
foaf:homepage <https://doi.org/10.1109/TEST.2004.1386980>
dc:identifier DBLP conf/itc/TangWVHWEPB04 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2004.1386980 (xsd:string)
dcterms:issued 2004 (xsd:gYear)
rdfs:label X-Masking During Logic BIST and Its Impact on Defect Coverage. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bernd_Becker_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Friedrich_Hapke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hans-Joachim_Wunderlich>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Harald_P._E._Vranken>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ilia_Polian>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Wittke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Piet_Engelke>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yuyi_Tang>
swrc:pages 442-451 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2004>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/TangWVHWEPB04/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/TangWVHWEPB04>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2004.html#TangWVHWEPB04>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2004.1386980>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:subject X-Masking, Logic BIST, Defect Coverage,Resistive Bridging Faults (xsd:string)
dc:title X-Masking During Logic BIST and Its Impact on Defect Coverage. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document