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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/TehranipourN02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mehrdad_Nourani>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mohammad_H._Tehranipour>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2002.1041866>
foaf:homepage <https://doi.org/10.1109/TEST.2002.1041866>
dc:identifier DBLP conf/itc/TehranipourN02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2002.1041866 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mehrdad_Nourani>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mohammad_H._Tehranipour>
swrc:pages 1093-1102 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/TehranipourN02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/TehranipourN02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2002.html#TehranipourN02>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2002.1041866>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:subject Diagnosis, Embedded Microprocessor, Integrity Loss, Interconnect Testing, Noise Detection, Signal Integrity, System-on-Chip, Test Pattern Generation (xsd:string)
dc:title Signal Integrity Loss in SoC's Interconnects: A Diagnosis Approach Using Embedded Microprocessor. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document