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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/TomishimaTNMHTG02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hideto_Hidaka>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hiroaki_Tanizaki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kenji_Gamo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Masanao_Maruta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mitsutaka_Niiro>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Tomishima>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/T._Tada>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2002.1041758>
foaf:homepage <https://doi.org/10.1109/TEST.2002.1041758>
dc:identifier DBLP conf/itc/TomishimaTNMHTG02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2002.1041758 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hideto_Hidaka>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hiroaki_Tanizaki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kenji_Gamo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Masanao_Maruta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mitsutaka_Niiro>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shigeki_Tomishima>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/T._Tada>
swrc:pages 170-177 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/TEST.2002.1041758>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title A Variable Drivability (VD) Output Buffer for the System In a Package (SIP) and High Frequency Wafer Test. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document