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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/VoorakaranamNCCKMC03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
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dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_M._Majernik>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ramakrishna_Voorakaranam>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Randy_Newby>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sasikumar_Cherubal>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thomas_Kuehl>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1271106>
foaf:homepage <https://doi.org/10.1109/TEST.2003.1271106>
dc:identifier DBLP conf/itc/VoorakaranamNCCKMC03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2003.1271106 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Abhijit_Chatterjee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bob_Cometta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_M._Majernik>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ramakrishna_Voorakaranam>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Randy_Newby>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sasikumar_Cherubal>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thomas_Kuehl>
swrc:pages 1174-1181 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/TEST.2003.1271106>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document