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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/WangCLCHWHY03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Chih-Wea_Wang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Frank_Huang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hong-Tzer_Yang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jih-Nung_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuo-Liang_Cheng>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yung-Fa_Chou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FTEST.2003.1270822>
foaf:homepage <https://doi.org/10.1109/TEST.2003.1270822>
dc:identifier DBLP conf/itc/WangCLCHWHY03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FTEST.2003.1270822 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Fault Pattern Oriented Defect Diagnosis for Memories. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Cheng-Wen_Wu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Tsun_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Chih-Wea_Wang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Frank_Huang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hong-Tzer_Yang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jih-Nung_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuo-Liang_Cheng>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yung-Fa_Chou>
swrc:pages 29-38 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/itc/WangCLCHWHY03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/itc/WangCLCHWHY03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2003.html#WangCLCHWHY03>
rdfs:seeAlso <https://doi.org/10.1109/TEST.2003.1270822>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:subject bitmap, failure analysis (FA), fault pattern, memory testing, memory diagnostics, semiconductor memory (xsd:string)
dc:title Fault Pattern Oriented Defect Diagnosis for Memories. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document