Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/itc/WohlW96
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Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates.
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Test Generation for Ultra-Large Circuits Using ATPG Constraints and Test-Pattern Templates.
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