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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/itc/XunYFATH23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hanzhi_Xun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sicong_Yuan>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FITC51656.2023.00041>
foaf:homepage <https://doi.org/10.1109/ITC51656.2023.00041>
dc:identifier DBLP conf/itc/XunYFATH23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FITC51656.2023.00041 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Device-Aware Test for Ion Depletion Defects in RRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hanzhi_Xun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hassen_Aziza>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Moritz_Fieback>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sicong_Yuan>
swrc:pages 246-255 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/itc/2023>
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rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/itc/itc2023.html#XunYFATH23>
rdfs:seeAlso <https://doi.org/10.1109/ITC51656.2023.00041>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/itc>
dc:title Device-Aware Test for Ion Depletion Defects in RRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document