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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iwinac/JuradoEPM09>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonio_Jurado-Lucena>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Escot-Bocanegra>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_Poyatos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ignacio_Montiel_S%E2%88%9A%C2%B0nchez>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-642-02264-7%5F53>
foaf:homepage <https://doi.org/10.1007/978-3-642-02264-7_53>
dc:identifier DBLP conf/iwinac/JuradoEPM09 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-642-02264-7%5F53 (xsd:string)
dcterms:issued 2009 (xsd:gYear)
rdfs:label Application of Artificial Neural Networks to Complex Dielectric Constant Estimation from Free-Space Measurements. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonio_Jurado-Lucena>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Escot-Bocanegra>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_Poyatos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ignacio_Montiel_S%E2%88%9A%C2%B0nchez>
swrc:pages 517-526 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iwinac/2009-1>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iwinac/JuradoEPM09/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iwinac/JuradoEPM09>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iwinac/iwinac2009-1.html#JuradoEPM09>
rdfs:seeAlso <https://doi.org/10.1007/978-3-642-02264-7_53>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iwinac>
dc:subject Materials characterization; complex permittivity; free-space measurements; multilayer perceptron; radial basis function (xsd:string)
dc:title Application of Artificial Neural Networks to Complex Dielectric Constant Estimation from Free-Space Measurements. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document