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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iwpc/JahnkeNW00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_Niere>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_P._Wadsack>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jens_H._Jahnke>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FWPC.2000.852476>
foaf:homepage <https://doi.org/10.1109/WPC.2000.852476>
dc:identifier DBLP conf/iwpc/JahnkeNW00 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FWPC.2000.852476 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Automated Quality Analysis of Component Software for Embedded Systems. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_Niere>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/J%E2%88%9A%E2%88%82rg_P._Wadsack>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jens_H._Jahnke>
swrc:pages 18-26 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/iwpc/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/iwpc/JahnkeNW00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/iwpc/JahnkeNW00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/iwpc/iwpc2000.html#JahnkeNW00>
rdfs:seeAlso <https://doi.org/10.1109/WPC.2000.852476>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iwpc>
dc:subject Java, embedded systems, quality assurance, smart cards, pattern detection, graph rewrite rules (xsd:string)
dc:title Automated Quality Analysis of Component Software for Embedded Systems. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document