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<http://dblp.uni-trier.de/rec/bibtex/conf/iwsm/2008>
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<https://dblp.l3s.de/d2r/resource/authors/Alain_Abran>
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dc:creator
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<https://dblp.l3s.de/d2r/resource/authors/Juan_Jose_Cuadrado-Gallego>
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<https://dblp.l3s.de/d2r/resource/authors/Reiner_R._Dumke>
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<https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_Braungarten>
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<https://dblp.l3s.de/d2r/resource/authors/Alain_Abran>
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<https://dblp.l3s.de/d2r/resource/authors/G%E2%88%9A%C4%BEnter_B%E2%88%9A%C4%BEren>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Juan_Jose_Cuadrado-Gallego>
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swrc:editor
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<https://dblp.l3s.de/d2r/resource/authors/Reiner_R._Dumke>
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<https://dblp.l3s.de/d2r/resource/authors/Ren%E2%88%9A%C2%A9_Braungarten>
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foaf:homepage
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<http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-89403-2>
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<https://doi.org/10.1007/978-3-540-89403-2>
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dc:identifier
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DBLP conf/iwsm/2008
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dc:identifier
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DOI doi.org%2F10.1007%2F978-3-540-89403-2
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dc:identifier
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ISBN 978-3-540-89402-5
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swrc:isbn
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ISBN 978-3-540-89402-5
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dcterms:issued
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2008
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rdfs:label
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Software Process and Product Measurement, International Conferences: IWSM 2008, Metrikon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008. Proceedings
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/BuglioneCM08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/BuglioneOD08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/CiolkowskiS08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/CryansAA08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/DanevaWB08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/Ebert08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/FarooqGD08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/Flohr08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/FrohnhoffE08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/Gencel08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/HamdanBS08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/Hampp08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/HeeringenS08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/HeidrichM08>
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<https://dblp.l3s.de/d2r/resource/publications/conf/iwsm/Vogelezang08>
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dc:publisher
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Springer
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<urn:isbn:978-3-540-89402-5>
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rdfs:seeAlso
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<http://amazon.com/s/ref=nb_ss_gw?field-keywords=978-3-540-89402-5>
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rdfs:seeAlso
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<https://doi.org/10.1007/978-3-540-89403-2>
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swrc:series
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<https://dblp.l3s.de/d2r/resource/conferences/iwsm>
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dcterms:tableOfContent
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<http://dblp.uni-trier.de/db/conf/iwsm/iwsm2008.html>
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dc:title
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Software Process and Product Measurement, International Conferences: IWSM 2008, Metrikon 2008, and Mensura 2008, Munich, Germany, November 18-19, 2008. Proceedings
(xsd:string)
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swrc:Proceedings
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foaf:Document
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swrc:volume
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5338
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