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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/iwsoc/HuhBMCNJV05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jau-Wen_Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kyungjin_Min>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Larry_D._Johnson>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Peter_Bendix>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ravindra_Narayan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Steven_H._Voldman>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yoon_Huh>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FIWSOC.2005.58>
foaf:homepage <https://doi.org/10.1109/IWSOC.2005.58>
dc:identifier DBLP conf/iwsoc/HuhBMCNJV05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FIWSOC.2005.58 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jau-Wen_Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kyungjin_Min>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Larry_D._Johnson>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Peter_Bendix>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ravindra_Narayan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Steven_H._Voldman>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yoon_Huh>
swrc:pages 47-53 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.1109/IWSOC.2005.58>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/iwsoc>
dc:title ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document