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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/jiisic/BuenoCSJ08>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Adalberto_Nobiato_Crespo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Cl%E2%88%9A%E2%84%A2nio_F._Salviano>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%B0rio_Jino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Paulo_Marcos_Siqueira_Bueno>
dc:identifier DBLP conf/jiisic/BuenoCSJ08 (xsd:string)
dcterms:issued 2008 (xsd:gYear)
rdfs:label Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Adalberto_Nobiato_Crespo>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/M%E2%88%9A%C2%B0rio_Jino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Paulo_Marcos_Siqueira_Bueno>
swrc:pages 147-154 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/jiisic/2008>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/jiisic/BuenoCSJ08/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/jiisic/BuenoCSJ08>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/jiisic/jiisic2008.html#BuenoCSJ08>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/jiisic>
dc:title Analysis of an Artifact Oriented Test Process Model and of Testing Aspects of ISO/IEC 15504. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document