IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/kbse/LiuJ0DLFCCWB21
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/kbse/LiuJ0DLFCCWB21
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Kangjie_Lu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Lirong_Fu
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Peiyu_Liu_0003
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Peng_Cheng_0001
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Qinming_Dai
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Raheem_Beyah
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Shouling_Ji
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wenhai_Wang
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Wenzhi_Chen
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Xuhong_Zhang_0002
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FASE51524.2021.9678785
>
foaf:
homepage
<
https://doi.org/10.1109/ASE51524.2021.9678785
>
dc:
identifier
DBLP conf/kbse/LiuJ0DLFCCWB21
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FASE51524.2021.9678785
(xsd:string)
dcterms:
issued
2021
(xsd:gYear)
rdfs:
label
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Kangjie_Lu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Lirong_Fu
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Peiyu_Liu_0003
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Peng_Cheng_0001
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Qinming_Dai
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Raheem_Beyah
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Shouling_Ji
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wenhai_Wang
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Wenzhi_Chen
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Xuhong_Zhang_0002
>
swrc:
pages
805-816
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/kbse/2021
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/kbse/LiuJ0DLFCCWB21/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/kbse/LiuJ0DLFCCWB21
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/kbse/ase2021.html#LiuJ0DLFCCWB21
>
rdfs:
seeAlso
<
https://doi.org/10.1109/ASE51524.2021.9678785
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/kbse
>
dc:
title
IFIZZ: Deep-State and Efficient Fault-Scenario Generation to Test IoT Firmware.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document