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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/kes/SapozhnikovaLLR99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Elena_P._Sapozhnikova>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/L._Ludwig>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V._P._Lunin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Rosenstiel>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FKES.1999.820198>
foaf:homepage <https://doi.org/10.1109/KES.1999.820198>
dc:identifier DBLP conf/kes/SapozhnikovaLLR99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FKES.1999.820198 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Elena_P._Sapozhnikova>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/L._Ludwig>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V._P._Lunin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wolfgang_Rosenstiel>
swrc:pages 361-364 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/kes/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/kes/SapozhnikovaLLR99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/kes/SapozhnikovaLLR99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/kes/kes1999.html#SapozhnikovaLLR99>
rdfs:seeAlso <https://doi.org/10.1109/KES.1999.820198>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/kes>
dc:title The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document