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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Herv%E2%88%9A%C2%A9_Lapuyade>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mateus_Bernardino_Moreira>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yann_Deval>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLASCAS56464.2023.10108219>
foaf:homepage <https://doi.org/10.1109/LASCAS56464.2023.10108219>
dc:identifier DBLP conf/lascas/MoreiraLRD23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLASCAS56464.2023.10108219 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label A Wide-Band High-Speed Sample and Hold in 0.35¬Ķm CMOS Technology. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mateus_Bernardino_Moreira>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yann_Deval>
swrc:pages 1-4 (xsd:string)
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dc:title A Wide-Band High-Speed Sample and Hold in 0.35¬Ķm CMOS Technology. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document