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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/latw/ChampacVGVS22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabian_Vargas_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hector_Villacorta>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Roberto_G%E2%88%9A%E2%89%A5mez-Fuentes>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLATS57337.2022.9936923>
foaf:homepage <https://doi.org/10.1109/LATS57337.2022.9936923>
dc:identifier DBLP conf/latw/ChampacVGVS22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLATS57337.2022.9936923 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabian_Vargas_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hector_Villacorta>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jaume_Segura_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Roberto_G%E2%88%9A%E2%89%A5mez-Fuentes>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/V%E2%88%9A%E2%89%A0ctor_H._Champac>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/latw/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/latw/ChampacVGVS22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/latw/ChampacVGVS22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/latw/lats2022.html#ChampacVGVS22>
rdfs:seeAlso <https://doi.org/10.1109/LATS57337.2022.9936923>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/latw>
dc:title Failure Probability due to Radiation-induced Effects in FinFET SRAM Cells under Process Variations. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document