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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/latw/ChenIT00>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Min-Hsing_P._Chen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sassan_Tabatabaei>
dc:identifier DBLP conf/latw/ChenIT00 (xsd:string)
dcterms:issued 2000 (xsd:gYear)
rdfs:label Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Andr%E2%88%9A%C2%A9_Ivanov>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Min-Hsing_P._Chen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sassan_Tabatabaei>
swrc:pages 42-46 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/latw/2000>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/latw/ChenIT00/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/latw/ChenIT00>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/latw/latw2000.html#ChenIT00>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/latw>
dc:title Defect Oriented Testing of an ECL/CMOS Level Converter Circuit. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document