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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/latw/CopettiMTHPB20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Leticia_Bolzani_Poehls>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thiago_Copetti>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tiago_R._Balen>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLATS49555.2020.9093667>
foaf:homepage <https://doi.org/10.1109/LATS49555.2020.9093667>
dc:identifier DBLP conf/latw/CopettiMTHPB20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLATS49555.2020.9093667 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Guilherme_Cardoso_Medeiros>
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mottaqiallah_Taouil>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thiago_Copetti>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tiago_R._Balen>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/latw/2020>
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rdfs:seeAlso <https://doi.org/10.1109/LATS49555.2020.9093667>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/latw>
dc:title Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document