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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/latw/MirabellaGFRDMR21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Antonino_La_Magna>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanna_Franchino>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Deretzis>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michelangelo_Grosso>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nunzio_Mirabella>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Salvatore_Rinaudo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLATS53581.2021.9651760>
foaf:homepage <https://doi.org/10.1109/LATS53581.2021.9651760>
dc:identifier DBLP conf/latw/MirabellaGFRDMR21 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLATS53581.2021.9651760 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Comparing different solutions for testing resistive defects in low-power SRAMs. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Antonino_La_Magna>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanna_Franchino>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ioannis_Deretzis>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michelangelo_Grosso>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nunzio_Mirabella>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Salvatore_Rinaudo>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/latw/2021>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/latw/MirabellaGFRDMR21/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/latw/MirabellaGFRDMR21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/latw/lats2021.html#MirabellaGFRDMR21>
rdfs:seeAlso <https://doi.org/10.1109/LATS53581.2021.9651760>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/latw>
dc:title Comparing different solutions for testing resistive defects in low-power SRAMs. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document