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dc:creator <https://dblp.l3s.de/d2r/resource/authors/Franco_Fiori>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Matteo_Vincenzo_Quitadamo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FLATS49555.2020.9093674>
foaf:homepage <https://doi.org/10.1109/LATS49555.2020.9093674>
dc:identifier DBLP conf/latw/PiumattiQRF20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FLATS49555.2020.9093674 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label Testing Heatsink Faults in Power Transistors by means of Thermal Model. (xsd:string)
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foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Matteo_Sonza_Reorda>
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rdfs:seeAlso <https://doi.org/10.1109/LATS49555.2020.9093674>
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dc:title Testing Heatsink Faults in Power Transistors by means of Thermal Model. (xsd:string)
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rdf:type swrc:InProceedings
rdf:type foaf:Document