Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/mascots/BhowmikDB16
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Biswajit_Bhowmik
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Jatindra_Kumar_Deka
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Santosh_Biswas
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMASCOTS.2016.52
>
foaf:
homepage
<
https://doi.org/10.1109/MASCOTS.2016.52
>
dc:
identifier
DBLP conf/mascots/BhowmikDB16
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMASCOTS.2016.52
(xsd:string)
dcterms:
issued
2016
(xsd:gYear)
rdfs:
label
Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Biswajit_Bhowmik
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Jatindra_Kumar_Deka
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Santosh_Biswas
>
swrc:
pages
394-399
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/mascots/2016
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/mascots/BhowmikDB16/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/mascots/BhowmikDB16
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/mascots/mascots2016.html#BhowmikDB16
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MASCOTS.2016.52
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/mascots
>
dc:
title
Towards a Scalable Test Solution for the Analysis of Interconnect Shorts in On-chip Networks.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document