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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mcsoc/TanH22>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sih_Pin_Tan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yung_It_Ho>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMCSoC57363.2022.00012>
foaf:homepage <https://doi.org/10.1109/MCSoC57363.2022.00012>
dc:identifier DBLP conf/mcsoc/TanH22 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMCSoC57363.2022.00012 (xsd:string)
dcterms:issued 2022 (xsd:gYear)
rdfs:label Scalability of Post-Silicon Test Generation for Multi-core RISC-V SOC Validation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sih_Pin_Tan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yung_It_Ho>
swrc:pages 14-17 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mcsoc/2022>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mcsoc/TanH22/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mcsoc/TanH22>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mcsoc/mcsoc2022.html#TanH22>
rdfs:seeAlso <https://doi.org/10.1109/MCSoC57363.2022.00012>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mcsoc>
dc:title Scalability of Post-Silicon Test Generation for Multi-core RISC-V SOC Validation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document