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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/metroi/PetritoliLS20>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Enrico_Petritoli>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabio_Leccese>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Schirripa_Spagnolo>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMetroInd4.0IoT48571.2020.9138296>
foaf:homepage <https://doi.org/10.1109/MetroInd4.0IoT48571.2020.9138296>
dc:identifier DBLP conf/metroi/PetritoliLS20 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMetroInd4.0IoT48571.2020.9138296 (xsd:string)
dcterms:issued 2020 (xsd:gYear)
rdfs:label In-Line Quality Control in Semiconductors Production and Availability for Industry 4.0. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Enrico_Petritoli>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabio_Leccese>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giuseppe_Schirripa_Spagnolo>
swrc:pages 665-668 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/metroi/2020>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/metroi/PetritoliLS20/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/metroi/PetritoliLS20>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/metroi/metroi2020.html#PetritoliLS20>
rdfs:seeAlso <https://doi.org/10.1109/MetroInd4.0IoT48571.2020.9138296>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/metroi>
dc:title In-Line Quality Control in Semiconductors Production and Availability for Industry 4.0. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document