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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/metroxraine/LiBGYLSDDMCFSS23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Crupi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Gugliandolo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Haoyun_Yuan>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Houjun_Sun>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jinkai_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Lili_Fang>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Liming_Si>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Linxiang_Shao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minghe_Du>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nicola_Donato>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Shuai_Li>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Xiue_Bao>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zlatica_Marinkovic>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMetroXRAINE58569.2023.10405715>
foaf:homepage <https://doi.org/10.1109/MetroXRAINE58569.2023.10405715>
dc:identifier DBLP conf/metroxraine/LiBGYLSDDMCFSS23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMetroXRAINE58569.2023.10405715 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Defect Modeling During the SLM Process for Manufacturing Microwave Devices. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Crupi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Giovanni_Gugliandolo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Haoyun_Yuan>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Houjun_Sun>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jinkai_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Lili_Fang>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Liming_Si>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Linxiang_Shao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minghe_Du>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nicola_Donato>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Shuai_Li>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Xiue_Bao>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zlatica_Marinkovic>
swrc:pages 412-416 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/metroxraine/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/metroxraine/LiBGYLSDDMCFSS23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/metroxraine/LiBGYLSDDMCFSS23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/metroxraine/metroxraine2023.html#LiBGYLSDDMCFSS23>
rdfs:seeAlso <https://doi.org/10.1109/MetroXRAINE58569.2023.10405715>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/metroxraine>
dc:title Defect Modeling During the SLM Process for Manufacturing Microwave Devices. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document