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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/micai/SantoyoOMS07>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Alejandro_Santoyo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jes%E2%88%9A%C4%BCs_Carlos_Pedraza_Ortega>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Joaqu%E2%88%9A%E2%89%A0n_Santoyo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/L._Felipe_Mej%E2%88%9A%E2%89%A0a>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-540-76631-5%5F60>
foaf:homepage <https://doi.org/10.1007/978-3-540-76631-5_60>
dc:identifier DBLP conf/micai/SantoyoOMS07 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-540-76631-5%5F60 (xsd:string)
dcterms:issued 2007 (xsd:gYear)
rdfs:label PCB Inspection Using Image Processing and Wavelet Transform. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Alejandro_Santoyo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jes%E2%88%9A%C4%BCs_Carlos_Pedraza_Ortega>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Joaqu%E2%88%9A%E2%89%A0n_Santoyo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/L._Felipe_Mej%E2%88%9A%E2%89%A0a>
swrc:pages 634-639 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/micai/2007>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/micai/SantoyoOMS07/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/micai/SantoyoOMS07>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/micai/micai2007.html#SantoyoOMS07>
rdfs:seeAlso <https://doi.org/10.1007/978-3-540-76631-5_60>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/micai>
dc:title PCB Inspection Using Image Processing and Wavelet Transform. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document