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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/miccai/YooHTLJ17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/David_G._C._Hildebrand>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Inwan_Yoo>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wei-Chung_Allen_Lee_0001>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Willie_F._Tobin>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Won-Ki_Jeong>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1007%2F978-3-319-67558-9%5F29>
foaf:homepage <https://doi.org/10.1007/978-3-319-67558-9_29>
dc:identifier DBLP conf/miccai/YooHTLJ17 (xsd:string)
dc:identifier DOI doi.org%2F10.1007%2F978-3-319-67558-9%5F29 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label ssEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/David_G._C._Hildebrand>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Inwan_Yoo>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wei-Chung_Allen_Lee_0001>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Willie_F._Tobin>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Won-Ki_Jeong>
swrc:pages 249-257 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/miccai/2017dlmia>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/miccai/YooHTLJ17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/miccai/YooHTLJ17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/miccai/dlmia2017.html#YooHTLJ17>
rdfs:seeAlso <https://doi.org/10.1007/978-3-319-67558-9_29>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/miccai>
dc:title ssEMnet: Serial-Section Electron Microscopy Image Registration Using a Spatial Transformer Network with Learned Features. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document