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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/micro/JungE23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jeageun_Jung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Mattan_Erez>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3613424.3614294>
foaf:homepage <https://doi.org/10.1145/3613424.3614294>
dc:identifier DBLP conf/micro/JungE23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3613424.3614294 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Predicting Future-System Reliability with a Component-Level DRAM Fault Model. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jeageun_Jung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Mattan_Erez>
swrc:pages 944-956 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/micro/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/micro/JungE23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/micro/JungE23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/micro/micro2023.html#JungE23>
rdfs:seeAlso <https://doi.org/10.1145/3613424.3614294>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/micro>
dc:title Predicting Future-System Reliability with a Component-Level DRAM Fault Model. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document