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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mipro/ZilakKS17>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Josip_Zilak>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Marko_Koricic>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Tomislav_Suligoj>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FMIPRO.2017.7973394>
foaf:homepage <https://doi.org/10.23919/MIPRO.2017.7973394>
dc:identifier DBLP conf/mipro/ZilakKS17 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FMIPRO.2017.7973394 (xsd:string)
dcterms:issued 2017 (xsd:gYear)
rdfs:label Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT). (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Josip_Zilak>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Marko_Koricic>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Tomislav_Suligoj>
swrc:pages 77-82 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mipro/2017>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mipro/ZilakKS17/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mipro/ZilakKS17>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mipro/mipro2017.html#ZilakKS17>
rdfs:seeAlso <https://doi.org/10.23919/MIPRO.2017.7973394>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mipro>
dc:title Analysis of hot carrier-induced degradation of Horizontal Current Bipolar Transistor (HCBT). (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document