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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mixdes/CazimajouSR23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Sarraute>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fr%E2%88%9A%C2%A9d%E2%88%9A%C2%A9ric_Richardeau>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Thibauld_Cazimajou>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FMIXDES58562.2023.10203258>
foaf:homepage <https://doi.org/10.23919/MIXDES58562.2023.10203258>
dc:identifier DBLP conf/mixdes/CazimajouSR23 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FMIXDES58562.2023.10203258 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label On the Electro-Thermal 2D FEM Parametric Analysis of SiC Vertical MOSFET Including Gate-Oxide Charge-Trapping Thermal Dependency: Application for Fast Transient Extreme Short-Circuit Operation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Emmanuel_Sarraute>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fr%E2%88%9A%C2%A9d%E2%88%9A%C2%A9ric_Richardeau>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Thibauld_Cazimajou>
swrc:pages 212-217 (xsd:string)
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rdfs:seeAlso <https://doi.org/10.23919/MIXDES58562.2023.10203258>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mixdes>
dc:title On the Electro-Thermal 2D FEM Parametric Analysis of SiC Vertical MOSFET Including Gate-Oxide Charge-Trapping Thermal Dependency: Application for Fast Transient Extreme Short-Circuit Operation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document