Design, Verification and Testing of a Readout Integrated Circuit for Hybrid Pixel X-ray Detectors with In-Pixel Time Measurement Functionality in 28 nm CMOS. | D2R Server publishing the DBLP Bibliography Database, hosted at L3S Research Center

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dc:creator	<https://dblp.l3s.de/d2r/resource/authors/Lukasz_A._Kadlubowski>
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rdfs:label	Design, Verification and Testing of a Readout Integrated Circuit for Hybrid Pixel X-ray Detectors with In-Pixel Time Measurement Functionality in 28 nm CMOS. (xsd:string)
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dc:title	Design, Verification and Testing of a Readout Integrated Circuit for Hybrid Pixel X-ray Detectors with In-Pixel Time Measurement Functionality in 28 nm CMOS. (xsd:string)
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