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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mixdes/PiskorskiPPRL18>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Henryk_M._Przewlocki>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Jasper_Ruhkopf>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Krzysztof_Piskorski>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Max_C._Lemme>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vikram_Passi>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FMIXDES.2018.8436596>
foaf:homepage <https://doi.org/10.23919/MIXDES.2018.8436596>
dc:identifier DBLP conf/mixdes/PiskorskiPPRL18 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FMIXDES.2018.8436596 (xsd:string)
dcterms:issued 2018 (xsd:gYear)
rdfs:label Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Henryk_M._Przewlocki>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Jasper_Ruhkopf>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Krzysztof_Piskorski>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Max_C._Lemme>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vikram_Passi>
swrc:pages 319-323 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mixdes/2018>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mixdes/PiskorskiPPRL18/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mixdes/PiskorskiPPRL18>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mixdes/mixdes2018.html#PiskorskiPPRL18>
rdfs:seeAlso <https://doi.org/10.23919/MIXDES.2018.8436596>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mixdes>
dc:title Photoelectric Measurements of the Modern Graphene-Insulator-Semiconductor (GIS) Test Structures. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document