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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mixdes/Wirth21>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Gilson_I._Wirth>
foaf:homepage <http://dx.doi.org/doi.org%2F10.23919%2FMIXDES52406.2021.9497643>
foaf:homepage <https://doi.org/10.23919/MIXDES52406.2021.9497643>
dc:identifier DBLP conf/mixdes/Wirth21 (xsd:string)
dc:identifier DOI doi.org%2F10.23919%2FMIXDES52406.2021.9497643 (xsd:string)
dcterms:issued 2021 (xsd:gYear)
rdfs:label Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Gilson_I._Wirth>
swrc:pages 14-19 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mixdes/2021>
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owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mixdes/Wirth21>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mixdes/mixdes2021.html#Wirth21>
rdfs:seeAlso <https://doi.org/10.23919/MIXDES52406.2021.9497643>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mixdes>
dc:title Modeling and Simulation of Charge Trapping in 1/f Noise, RTN and BTI: from Devices to Circuits. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document