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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mobicom/KimSJL23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hyunwoo_Jung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minkyu_Shim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Wootack_Kim>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Youngki_Lee>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1145%2F3615592.3616852>
foaf:homepage <https://doi.org/10.1145/3615592.3616852>
dc:identifier DBLP conf/mobicom/KimSJL23 (xsd:string)
dc:identifier DOI doi.org%2F10.1145%2F3615592.3616852 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Aggressive SRAM Voltage Scaling and Error Mitigation for Approximate DNN Inference. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hyunwoo_Jung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minkyu_Shim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Wootack_Kim>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Youngki_Lee>
swrc:pages 28-34 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mobicom/2023smartwear>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mobicom/KimSJL23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mobicom/KimSJL23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mobicom/smartwear2023.html#KimSJL23>
rdfs:seeAlso <https://doi.org/10.1145/3615592.3616852>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mobicom>
dc:title Aggressive SRAM Voltage Scaling and Error Mitigation for Approximate DNN Inference. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document