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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mocast/VassiosHP23>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Argirios._T._Hatzopoulos>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Dimitrios_K._Papakostas>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vassilios_D._Vassios>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMOCAST57943.2023.10176630>
foaf:homepage <https://doi.org/10.1109/MOCAST57943.2023.10176630>
dc:identifier DBLP conf/mocast/VassiosHP23 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMOCAST57943.2023.10176630 (xsd:string)
dcterms:issued 2023 (xsd:gYear)
rdfs:label Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Argirios._T._Hatzopoulos>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Dimitrios_K._Papakostas>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vassilios_D._Vassios>
swrc:pages 1-6 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mocast/2023>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mocast/VassiosHP23/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mocast/VassiosHP23>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mocast/mocast2023.html#VassiosHP23>
rdfs:seeAlso <https://doi.org/10.1109/MOCAST57943.2023.10176630>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mocast>
dc:title Improved Fault Detection of Analog Circuits by utilizing the Fundamental RMS of the Supply Current Fluctuation. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document