Dynamic electrical characterization of CMOS-like Thin Film Transistor circuits.
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dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/mse/GautierCB03
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/G._Gautier
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Olivier_Bonnaud
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Samuel_Crand
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMSE.2003.1205233
>
foaf:
homepage
<
https://doi.org/10.1109/MSE.2003.1205233
>
dc:
identifier
DBLP conf/mse/GautierCB03
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMSE.2003.1205233
(xsd:string)
dcterms:
issued
2003
(xsd:gYear)
rdfs:
label
Dynamic electrical characterization of CMOS-like Thin Film Transistor circuits.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/G._Gautier
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Olivier_Bonnaud
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Samuel_Crand
>
swrc:
pages
14-15
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/mse/2003
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/mse/GautierCB03/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/mse/GautierCB03
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/mse/mse2003.html#GautierCB03
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MSE.2003.1205233
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/mse
>
dc:
title
Dynamic electrical characterization of CMOS-like Thin Film Transistor circuits.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document