| Property | Value |
|---|
|
dcterms:bibliographicCitation
|
<http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/2003>
|
|
foaf:homepage
|
<https://ieeexplore.ieee.org/xpl/conhome/8664/proceeding>
|
|
dc:identifier
|
DBLP conf/mtdt/2003
(xsd:string)
|
|
dc:identifier
|
ISBN 0-7695-2004-9
(xsd:string)
|
|
swrc:isbn
|
ISBN 0-7695-2004-9
(xsd:string)
|
|
dcterms:issued
|
2003
(xsd:gYear)
|
|
rdfs:label
|
11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA
(xsd:string)
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Aitken03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Al-ArsG03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Al-ArsHG03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Barth03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/ChoiPLKP03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/CockburnTE03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/DagaPRCSG03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/HuangDWL03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Prince03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/SalamonC03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Vollrath03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/WangYI03>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/ZendaNF03>
|
|
dc:publisher
|
IEEE Computer Society
(xsd:string)
|
|
owl:sameAs
|
<http://bibsonomy.org/uri/bibtexkey/conf/mtdt/2003/dblp>
|
|
owl:sameAs
|
<http://dblp.rkbexplorer.com/id/conf/mtdt/2003>
|
|
owl:sameAs
|
<urn:isbn:0-7695-2004-9>
|
|
rdfs:seeAlso
|
<http://amazon.com/s/ref=nb_ss_gw?field-keywords=0-7695-2004-9>
|
|
rdfs:seeAlso
|
<https://ieeexplore.ieee.org/xpl/conhome/8664/proceeding>
|
|
swrc:series
|
<https://dblp.l3s.de/d2r/resource/conferences/mtdt>
|
|
dcterms:tableOfContent
|
<http://dblp.uni-trier.de/db/conf/mtdt/mtdt2003.html>
|
|
dc:title
|
11th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2003), 28-29 July 2003, San Jose, CA, USA
(xsd:string)
|
|
dc:type
|
<http://purl.org/dc/dcmitype/Collection>
|
|
rdf:type
|
swrc:Proceedings
|
|
rdf:type
|
foaf:Document
|
![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)