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ISBN 0-7695-2193-2
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dcterms:issued
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2004
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rdfs:label
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12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA
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IEEE Computer Society
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12th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2004), 9-10 August 2004, San Jose, CA, USA
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