| Property | Value |
|---|
|
dcterms:bibliographicCitation
|
<http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/2005>
|
|
foaf:homepage
|
<https://ieeexplore.ieee.org/xpl/conhome/10032/proceeding>
|
|
dc:identifier
|
DBLP conf/mtdt/2005
(xsd:string)
|
|
dc:identifier
|
ISBN 0-7695-2313-7
(xsd:string)
|
|
swrc:isbn
|
ISBN 0-7695-2313-7
(xsd:string)
|
|
dcterms:issued
|
2005
(xsd:gYear)
|
|
rdfs:label
|
13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan
(xsd:string)
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/BanerjeeCB05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/BreitwischLJMZ05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/ChangWK05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/ChengH05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/DuMCR05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/HamdiouiAGW05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/HsiaoK05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/HuaCH05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/KushidaOHT05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LeeJSTCL05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LeeWK05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LiH05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LiSWLS05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LinLHLLHWHLH05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LinesMOPDPCNMPM05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/LuTH05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/McGaughyWH05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/OkhoninFJ05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/RaiterC05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/ShenHCL05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/SinghBD05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/SungCC05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/TsaiWC05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/WangL05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/WeyLQ05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/WuFK05>
|
|
is
dcterms:partOf
of
|
<https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/YehKWHC05>
|
|
dc:publisher
|
IEEE Computer Society
(xsd:string)
|
|
owl:sameAs
|
<http://bibsonomy.org/uri/bibtexkey/conf/mtdt/2005/dblp>
|
|
owl:sameAs
|
<http://dblp.rkbexplorer.com/id/conf/mtdt/2005>
|
|
owl:sameAs
|
<urn:isbn:0-7695-2313-7>
|
|
rdfs:seeAlso
|
<http://amazon.com/s/ref=nb_ss_gw?field-keywords=0-7695-2313-7>
|
|
rdfs:seeAlso
|
<https://ieeexplore.ieee.org/xpl/conhome/10032/proceeding>
|
|
swrc:series
|
<https://dblp.l3s.de/d2r/resource/conferences/mtdt>
|
|
dcterms:tableOfContent
|
<http://dblp.uni-trier.de/db/conf/mtdt/mtdt2005.html>
|
|
dc:title
|
13th IEEE International Workshop on Memory Technology, Design, and Testing (MTDT 2005), 3-5 August 2005, Taipei, Taiwan
(xsd:string)
|
|
dc:type
|
<http://purl.org/dc/dcmitype/Collection>
|
|
rdf:type
|
swrc:Proceedings
|
|
rdf:type
|
foaf:Document
|
![[RDF data]](https://dblp.l3s.de/d2r/snorql/rdf_flyer.24.gif)