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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/Al-ArsG03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2003.1222357>
foaf:homepage <https://doi.org/10.1109/MTDT.2003.1222357>
dc:identifier DBLP conf/mtdt/Al-ArsG03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2003.1222357 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
swrc:pages 27-32 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/Al-ArsG03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/Al-ArsG03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2003.html#Al-ArsG03>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2003.1222357>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:subject DRAMs, dynamic faults, two floating nodes, defect simulation, memory testing (xsd:string)
dc:title Systematic Memory Test Generation for DRAM Defects Causing Two Floating Nodes. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document