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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/ChoiPLKP03>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Minsu_Choi>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Nohpill_Park>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Piuri>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yong-Bin_Kim>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2003.1222363>
foaf:homepage <https://doi.org/10.1109/MTDT.2003.1222363>
dc:identifier DBLP conf/mtdt/ChoiPLKP03 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2003.1222363 (xsd:string)
dcterms:issued 2003 (xsd:gYear)
rdfs:label Optimal Spare Utilization in Repairable and Reliable Memory Cores. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Fabrizio_Lombardi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Minsu_Choi>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Nohpill_Park>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Vincenzo_Piuri>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yong-Bin_Kim>
swrc:pages 64-71 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2003>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/ChoiPLKP03/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/ChoiPLKP03>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2003.html#ChoiPLKP03>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2003.1222363>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:subject Embedded Memory Repair and Reliability, System-on-chip, Fault-Tolerant Memory Core, Built-In-Self-Repair, Yield (xsd:string)
dc:title Optimal Spare Utilization in Repairable and Reliable Memory Cores. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document