Impact of stresses on the fault coverage of memory tests.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/HamdiouiAGW05
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/HamdiouiAGW05
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Rob_Wadsworth
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2005.26
>
foaf:
homepage
<
https://doi.org/10.1109/MTDT.2005.26
>
dc:
identifier
DBLP conf/mtdt/HamdiouiAGW05
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMTDT.2005.26
(xsd:string)
dcterms:
issued
2005
(xsd:gYear)
rdfs:
label
Impact of stresses on the fault coverage of memory tests.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Rob_Wadsworth
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui
>
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars
>
swrc:
pages
103-108
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2005
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/mtdt/HamdiouiAGW05/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/mtdt/HamdiouiAGW05
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/mtdt/mtdt2005.html#HamdiouiAGW05
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MTDT.2005.26
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/mtdt
>
dc:
title
Impact of stresses on the fault coverage of memory tests.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document