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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/HamdiouiAGW05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Rob_Wadsworth>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2005.26>
foaf:homepage <https://doi.org/10.1109/MTDT.2005.26>
dc:identifier DBLP conf/mtdt/HamdiouiAGW05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2005.26 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label Impact of stresses on the fault coverage of memory tests. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Ad_J._van_de_Goor>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Rob_Wadsworth>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Said_Hamdioui>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Zaid_Al-Ars>
swrc:pages 103-108 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/HamdiouiAGW05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/HamdiouiAGW05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2005.html#HamdiouiAGW05>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2005.26>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:title Impact of stresses on the fault coverage of memory tests. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document