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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/Khubchandani99>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Raju_Khubchandani>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.1999.782687>
foaf:homepage <https://doi.org/10.1109/MTDT.1999.782687>
dc:identifier DBLP conf/mtdt/Khubchandani99 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.1999.782687 (xsd:string)
dcterms:issued 1999 (xsd:gYear)
rdfs:label A Fast Test to Generate Flash Memory Threshold Voltage Distribution Map. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Raju_Khubchandani>
swrc:pages 78-82 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/1999>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/Khubchandani99/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/Khubchandani99>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt1999.html#Khubchandani99>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.1999.782687>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:subject flash memory, memory testing, threshold voltage, bitmap (xsd:string)
dc:title A Fast Test to Generate Flash Memory Threshold Voltage Distribution Map. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document