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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/RedekerCEXU02>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Bruce_F._Cockburn>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Duncan_G._Elliott>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Michael_Redeker>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sue_Ann_Ung>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yunan_Xiang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2002.1029772>
foaf:homepage <https://doi.org/10.1109/MTDT.2002.1029772>
dc:identifier DBLP conf/mtdt/RedekerCEXU02 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2002.1029772 (xsd:string)
dcterms:issued 2002 (xsd:gYear)
rdfs:label Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Bruce_F._Cockburn>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Duncan_G._Elliott>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Michael_Redeker>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sue_Ann_Ung>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yunan_Xiang>
swrc:pages 117-122 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2002>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/RedekerCEXU02/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/RedekerCEXU02>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2002.html#RedekerCEXU02>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2002.1029772>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:title Fault Modeling and Pattern-Sensitivity Testing for a Multilevel DRAM. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document