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dcterms:bibliographicCitation <http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/ShenHCL05>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Hung-Ming_Hsu>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Sheng-Chih_Shen>
dc:creator <https://dblp.l3s.de/d2r/resource/authors/Yi-Wei_Chang>
foaf:homepage <http://dx.doi.org/doi.org%2F10.1109%2FMTDT.2005.9>
foaf:homepage <https://doi.org/10.1109/MTDT.2005.9>
dc:identifier DBLP conf/mtdt/ShenHCL05 (xsd:string)
dc:identifier DOI doi.org%2F10.1109%2FMTDT.2005.9 (xsd:string)
dcterms:issued 2005 (xsd:gYear)
rdfs:label A high speed BIST architecture for DDR-SDRAM testing. (xsd:string)
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Hung-Ming_Hsu>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Kuen-Jong_Lee>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Sheng-Chih_Shen>
foaf:maker <https://dblp.l3s.de/d2r/resource/authors/Yi-Wei_Chang>
swrc:pages 52-57 (xsd:string)
dcterms:partOf <https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/2005>
owl:sameAs <http://bibsonomy.org/uri/bibtexkey/conf/mtdt/ShenHCL05/dblp>
owl:sameAs <http://dblp.rkbexplorer.com/id/conf/mtdt/ShenHCL05>
rdfs:seeAlso <http://dblp.uni-trier.de/db/conf/mtdt/mtdt2005.html#ShenHCL05>
rdfs:seeAlso <https://doi.org/10.1109/MTDT.2005.9>
swrc:series <https://dblp.l3s.de/d2r/resource/conferences/mtdt>
dc:title A high speed BIST architecture for DDR-SDRAM testing. (xsd:string)
dc:type <http://purl.org/dc/dcmitype/Text>
rdf:type swrc:InProceedings
rdf:type foaf:Document