Modeling and Testing Transistor Faults in Content-Addressable Memories.
Resource URI: https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/Sidorowicz99
Home
|
Example Publications
Property
Value
dcterms:
bibliographicCitation
<
http://dblp.uni-trier.de/rec/bibtex/conf/mtdt/Sidorowicz99
>
dc:
creator
<
https://dblp.l3s.de/d2r/resource/authors/Piotr_R._Sidorowicz
>
foaf:
homepage
<
http://dx.doi.org/doi.org%2F10.1109%2FMTDT.1999.782688
>
foaf:
homepage
<
https://doi.org/10.1109/MTDT.1999.782688
>
dc:
identifier
DBLP conf/mtdt/Sidorowicz99
(xsd:string)
dc:
identifier
DOI doi.org%2F10.1109%2FMTDT.1999.782688
(xsd:string)
dcterms:
issued
1999
(xsd:gYear)
rdfs:
label
Modeling and Testing Transistor Faults in Content-Addressable Memories.
(xsd:string)
foaf:
maker
<
https://dblp.l3s.de/d2r/resource/authors/Piotr_R._Sidorowicz
>
swrc:
pages
83-90
(xsd:string)
dcterms:
partOf
<
https://dblp.l3s.de/d2r/resource/publications/conf/mtdt/1999
>
owl:
sameAs
<
http://bibsonomy.org/uri/bibtexkey/conf/mtdt/Sidorowicz99/dblp
>
owl:
sameAs
<
http://dblp.rkbexplorer.com/id/conf/mtdt/Sidorowicz99
>
rdfs:
seeAlso
<
http://dblp.uni-trier.de/db/conf/mtdt/mtdt1999.html#Sidorowicz99
>
rdfs:
seeAlso
<
https://doi.org/10.1109/MTDT.1999.782688
>
swrc:
series
<
https://dblp.l3s.de/d2r/resource/conferences/mtdt
>
dc:
title
Modeling and Testing Transistor Faults in Content-Addressable Memories.
(xsd:string)
dc:
type
<
http://purl.org/dc/dcmitype/Text
>
rdf:
type
swrc:InProceedings
rdf:
type
foaf:Document